ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,658, issued on April 21, was assigned to QUALCOMM Inc. (San Diego). "Current sensor with a time-interleaved impedance compensation scheme"... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,659, issued on April 21, was assigned to ASUSTeK COMPUTER INC. (Taipei City, Taiwan). "Method and system for detecting application program... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,660, issued on April 21, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich). "Configurable radio frequency system" was invented by Nic... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,661, issued on April 21, was assigned to The United States of America as represented by the Secretary of the Army (Washington). "Simultane... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,662, issued on April 21, was assigned to Mitsubishi Electric Research Laboratories Inc.. "Phase identification of power distribution syste... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,663, issued on April 21, was assigned to Electric Power Research Institute of Yunnan Power Grid Co. Ltd (Yunnan, China). "Method and syste... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,664, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Transmitting and receiving circuit includi... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,665, issued on April 21, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Electronic devices related to monitoring of internal nod... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,666, issued on April 21, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Electrical and logic isolation for systems on a chip" was inven... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,667, issued on April 21, was assigned to Tektronix Inc. (Beaverton, Ore.). "System and method for detection of anomalies in test and measu... Read More